I am trying to perform reliability analysis in Cadence Virtuoso, however the foundry do not provide AgeMOS models for process node, I use. So my question is: Is there please a workaround to reach at least approximate results of NBTI, HCI, ageing effects on circuit?
For example, I suppose I could define analytical equations of mentioned phenomenons. Results will be far from fitting real data, but I need to see just a trend. If there is similar solution, somebody can explain me, my tremendous thank would belong to him 🙂